Atomic force microscope (AFM) - Veeco
Atomic Force Microscope Veeco CP-II
- Operation mode: contact and non-contact AFM, LFM, STM... Scanning range (area): 100 µm x 100 µm Scanning range (vertical): 7,5 µm Resolution: lateral - 0.25 Å; vertical - 0.025 Å Analysis: 2D and 3D topography with atomic resolution, roughness parameters, nano-friction, nano-hardness...